Advanced Technology Development We Are Pursuing

We focus on research and development that solves manufacturing-site issues at their root through semiconductor test data analysis using AI and statistical methods.

As one result of these efforts, we have filed patent applications in Japan and the United States for the following technology.

Patent-Pending Technology

Patent Title

Semiconductor Wafer Inspection Apparatus, Semiconductor Wafer Inspection Method, and Recording Medium

Application Status

Patent pending in Japan / Patent pending in the United States

Features

Contributes to high-precision detection of minute defects, yield improvement, and TAT reduction

Our Vision

Future Outlook

Based on our currently pending patent technology, we are advancing the practical application of multiple additional technologies.

By providing technologies that are truly useful on semiconductor manufacturing sites, we will contribute to the future of the industry.